Surface Topography – Scanning Electron Microscopy (SEM)

Home » Surface Topography – Scanning Electron Microscopy (SEM)

Surface Topography SEM

The topography of a surface is known to substantially affect the bulk properties of a material. Many times there is nanoscale morphology in surface anomalies and a desired interest in their resultant influence. This surface topography is mainly investigated and observed by microscopic measurements.

The characterization of surface topography has become increasingly important in many fields and through the increasing resolution and simplification of microscopic devices, such as SEM, (scanning electron microscopy), the move from sophisticated and dedicated operations to a benchtop, user friendly device has transformed the industry.

Best of Both Worlds:

The Phenom World Scanning Electron Microscope (SEM) product line was engineered from scratch not only to create the most versatile instrument to match the demand of an increasingly competitive scientific community, but to also create the most fulfilling experience for the user.

One unique feature of the Phenom SEM products is the standard Backscatter Electron Detector (BSD). This allows the user to analyze both the topological and elemental characteristics of the sample in addition to several other post process analyses such as 3D surface reconstruction, pore size, particle size, and fiber analysis.

Phenom SEM Technology:

The Phenom: World’s Fastest Scanning Electron Microscope:

With its market-leading Phenom desktop Scanning Electron Microscope (SEM), Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

Phenomenal Imaging and Analysis Power:

Imaging power up to 130,000x magnification
Unmatched ease of use by intuitive system control
Fully integrated X-ray analysis
Fastest time from loading sample to SEM image (< 30 sec) by using an integrated X, Y motor stage
“Never lost” navigation by combination of optical navigation camera and low magnification SEM imaging

Phenom Markets & Applications:

From Biological Development to Pharmaceutics:

The Phenom is a perfect tool for investigating mold spores or analyzing pharmaceutical powders. A vast variety of sample holders allows biological and pharmaceutical sample analysis without difficult sample preparation.

From Process Control to Quality Assurance:

The Phenom desktop SEM is the ideal tool for processing samples and evaluating quality in a short span of time. The rapid sample preparation and the incredibly short feedback time improve the efficiency and effectiveness of the failure analysis.

From Material Characterization to Metallurgy Analysis:

The Phenom allows operators to perform microstructural analysis and non-destructive testing of metals to identify variations that occur after treatment, and to determine compositional contrast.

All-round Forensic Investigation:

The Phenom is used to perform ballistic research, identify scratches and indents from tool marks,human and animal hair classification or scrutinizing residues such as sand and diatoms.

Phenom Desktop:

The Phenom desktop SEM is equipped with a long lifetime, high brightness CeB6-source. This allows the user to create state-of-the-art images with a minimum of maintenance intervention. The Phenom Pure is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high resolution imaging, providing the best imaging results in its class.

Phenom Pure:

Intuitive user interface, maximum employability
Magnification range: 70 – 30,000x
Images up to 2048 x 2048 pixels
Resolution: ≤ 30 nm
Acceleration voltage: 5 kV

Phenom Pro:

Magnification range: 80 – 130,000x
Full color navigation camera: 20 – 135x magnification
Resolution: ≤ 10 nm
Acceleration voltages: 5 kV and 10 kV
Optional: ProSuite software application

Phenom ProX. The Top-of-the-Range for High-Resolution Imaging and Analysis:

The Phenom ProX desktop SEM is the ultimate all-in-one imaging and EDS analysis system. The advanced system identifies different elements in a specimen by using the fully integrated Element Identification software and specially designed EDS detector. The optional Elemental Mapping and Line Scan software provides information on the distribution of elements within the sample or the selected line. The results of the analysis can easily be exported and reported.

Phenom ProX:

Fully integrated X-ray analysis
Element detection range: B – Am
Magnification range: 80 – 130,000x
Resolution: ≤ 10 nm
Acceleration voltages: 5 kV, 10 kV
and 15 kV
Standard ProSuite application
software installed
Optional: Elemental Mapping and
Line Scan software application

Phenom Software Applications:

Automated and Market-Specific Software Solutions:

The Phenom ProSuite has been developed to enable Phenom users to extract maximum information from images made with the Phenom desktop Scanning
Electron Microscope (SEM). The software is installed on a monitor-mounted PC, leaving the Phenom imaging unit in its original state and guaranteeing maximum system stability.
  • null

    ProSuite:

    • Automated collection of images

    • Real-time remote control

    • Intuitive single-page user interface

    • Standard applications included: Automated Image Mapping & Remote User Interface

  • null

    PoreMetric:

    • Fully automated visualization and analysis of pores

    • Detection of pore size range 100nm – 0,1mm

    • Statistical data with high-quality images

  • null

    ParticleMetric:

    • Morphology and particle size data for submicron particle applications

    • Detection of particles from 100nm to 100μm

    • Easy data to export to histograms and scatter plots

  • null

    3D Roughness Reconstruction:

    • Intuitive user interface, maximum employability

    • Based on “shape from shading” technology, no stage tilt required

    • Fast reconstruction

  • null

    FiberMetric:

    • Fast and automated collection of all statistical data

    • Large range of fibers and pores can be measured

    • View and measure micro and nano fibers with unmatched

  • null

    Element Identification (EID):

    • Fully integrated software for X-ray analysis

    • Precise spot mode analysis to identify hidden elements

    • Optional: Elemental Mapping and Line Scan software app

SEM Sample Holders:

Large Variety of Sample-Loading Accessories:

For all Phenom desktop SEM a large variety of sample holders is available in order to extend the sample application range.
These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market. In addition to the sample holders, Phenom-World has two inserts for specific sample types. These inserts enable fast sample preparation and speed up the sample throughput times.

Standard Sample Holders & Inserts:

  • null

    Standard Sample Holder

  • null

    Charge Reduction Sample Holder

  • null

    Metallurgical Sample Holder

  • null

    Metallurgical Charge Reduction Sample Holder

  • null

    Micro-Tool Sample Holder

  • null

    X-view Insert*

  • null

    Micro-Electronics Insert*

* Requires Metallurgical Sample Holder or Metallurgical Charge Reduction Sample Holder

Active Sample Holders:

Motorized Tilt & Rotation Sample Holder:

• Continuous 360° compucentric rotation

• Tilt range -10° to +45°

• Tilt adapted focus

• Controlled by dedicated Motion Control

Temperature Controlled Sample Holder

• Temperature range -25°C to +50°C

• Temperature accuracy ±1.5°C

• Maximum cooling rate 20°C/min

• Water-cooled by a self contained closed-loop water chiller box